Multiview x-ray inspection system
OwnerSatpal Singhinventor
Life of this patent
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Abstract
A multiview x-ray scanning system for inspecting the 3D volume of an object has been presented. The method uses multiple x-ray sources and multiple x-ray beams. The object to be inspected is interposed in the trajectory of these beams and moved relative to these beams. The x-ray beams after passing through the object are detected by detectors that are interleaved to realize a compact design. In order that the interleaved detectors do not intersect, the location of detectors and sources is adjusted. Further, the design of detectors is such that they can be placed in close proximity to each other in order to realize a small footprint scanner having a high resolution.
Claims11
A method of inspecting an object comprising the steps of:
- using at least a first radiation source generating a first radiation;
- positioning a plurality of radiation detectors comprising a first set of detectors such that said first radiation is incident on each detector along a first set of paths that are oriented at different angles;
- generating a second radiation using a second radiation source;
- orienting said second radiation such that it is at an angle to said first radiation;
- positioning a plurality of radiation detectors comprising a second set of detectors such that said second radiation is incident on each detector along a second set of paths that are oriented at different angles;
- further interleaving detectors in said first set of detectors with detectors in said second set of detectors;
- interposing said object between said first source and said first set of detectors, and between said second source and said second set of detectors;
- translating said object relative to said first and second radiations;
- and
- analyzing data received from said first set of detectors and said second set of detectors.
An apparatus for inspecting an object comprising of:
- a first radiation source generating a first radiation;
- a plurality of radiation detectors comprising a first set of detectors positioned such that said first radiation is incident on said detectors along a first set of paths that are oriented at different angles;
- a second radiation source generating a second radiation oriented such that said second radiation is at an angle to said first radiation;
- a plurality of radiation detectors comprising a second set of detectors positioned such that said second radiation is incident on said detectors along a second set of paths that are oriented at different angles;
- further, the arrangement of said detectors is such that detectors in said first set of detectors are interleaved with detectors in said second set of detectors;
- a means to interpose said object between said first source and said first set of detectors, and between said second source and said second set of detectors;
- a means to translate object relative to said first and second radiations;
- and
- a means to analyze data received from said first set of detectors and said second set of detectors.
A radiation detector device to detect incident radiation, said detector device having a width dimension that is along a direction perpendicular to the path of said incident radiation, said detector device comprising of:
- at least one detector oriented so as to detect said incident radiation;
- and
- at least one electronics board arranged at an angle to said incident radiation that is substantially different from ninety degrees such that said width dimension of said detector device is reduced.
Dependencies are inferred from the claim text.