Method and apparatus for the three-dimensional measurement of the shape and the local surface normal of preferably specular objects
Assignee3D-Shape GmbH
InventorRalf Lampalzer
Life of this patent
Estimating the term…
Abstract
An apparatus and a method permit the 3D detection of specular objects which are transparent to visible light. The method operates on the basis of the principle of deflectometry with specific improvements.
Drawings
Claims10
A method for measuring a surface of a measurement object on the basis of the principle of deflectometry, the method comprising the following steps:
- providing a displaced, rotated or switched-over lighting device having at least one spatially linear source for electromagnetic radiation;
- providing an observation device having at least one camera sensitive to the electromagnetic radiation for recording a series of reflected images of the displaced, rotated or switched-over lighting device;
- rotating the at least one linear source for electromagnetic radiation or the measurement object through 90° with a rotary movement device;
- recording, with the observation device, the reflected images of the lighting device produced by reflection of the lighting device on the surface of the measurement object;
- and
- determining an inclination of the surface of the measurement object from a shape of the reflected images;
- wherein the at least one linear source for electromagnetic radiation is a plurality of lines applied to a background, the lines and the background having the same temperature, and the lines having a higher emission than the background due to a higher emission coefficient of a surface of the lines.
An apparatus for measuring a surface of a measurement object on the basis of the principle of deflectometry, the apparatus comprising:
- a displaced, rotated or switched-over lighting device having at least one linear source for electromagnetic radiation;
- a rotary movement device for rotating said at least one linear source for electromagnetic radiation or the measurement object through 90°;
- an observation device viewing a reflected image of said lighting device produced by reflection on the measurement object, said observation device having at least one camera sensitive to the electromagnetic radiation for recording a series of reflected images of said displaced, rotated or switched-over lighting device;
- and
- a computation and evaluation unit determining an inclination of the surface of the measurement object from a shape of the reflected image and a known location of said lighting device;
- wherein said at least one linear source for electromagnetic radiation is a plurality of lines applied to a background, said lines and said background having the same temperature, and said lines having a higher emission than said background due to a higher emission coefficient of a surface of said lines.
Dependencies are inferred from the claim text.