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US 8,283,939 B2Granted
Test probe
AssigneeHon Hai Precision Industry Co., Ltd.
InventorsShen-Chun Li, Shou-Kuo Hsu
Life of this patent
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Abstract
A test probe includes a filtering unit and a contact unit. The filtering unit includes an inductive component, a capacitive component, and an insulation component insulates the inductive component from the capacitive component. The contact unit contacts a test point to get a test signal. The filtering unit filters noise from the test signal. The test probe can be assembled and disassembled easily, and parameters of the filtering unit can be changed by changing structure of each component.
Claims11
A test probe comprising:
- a filtering unit comprising:
- an insulation component axially defining a through hole, with a restricting portion arranged in the through hole;
- an inductance component received in the through hole, the inductance component comprising a magnetic cylinder, a conductive coil insulated from and fitting around the magnetic cylinder, and a first and a second contacting tabs extending from opposite ends of the conductive coil;
- and
- a capacitance component comprising a metal inner tube fitting around the insulation component, a metal outer tube insulated from and fitting around the metal inner tube, and a third contacting tab extending from an end of the metal inner tube to contact the first contacting tab;
- and
- a contact unit comprising a retaining portion received in the through hole, abutting against the restricting portion and contacting the second contacting tab, and a tip portion extending from the retaining portion and passing through the restricting portion.
4 more elements
Dependencies are inferred from the claim text.