Sensor device with magnetic washing means
AssigneeKoninklijke Philips Electronics N.V.
InventorsJeroen Hans Nieuwenhuis, Petrus Johannes Wilhelmus Van Lankvelt
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Abstract
A sensor device for detecting magnetic particles in a sensitive region of a sample chamber includes a dump region. Magnetic particles can be moved by magnetic forces from the sensitive region into the dump region which is arranged such that the magnetic particles cannot return to the sensitive region by pure sedimentation. The separation between the sensitive and the dump region can optionally be enforced by a barrier.
Claims9
A microelectronic sensor device for the detection of magnetic particles comprising:
- a) a sample chamber in which a fluid containing the magnetic particles is provided;
- b) at least one sensor element that detects the magnetic particles in an associated sensing region at the bottom of the sample chamber;
- c) a magnetic manipulator that moves the magnetic particles from the sensing region to a dump region of the sample chamber, wherein
- the magnetic particles cannot reach the sensing region from the dump region by sedimentation, wherein the dump region is disposed laterally with respect to the sensing region, and wherein the sensor further comprises a barrier element that is disposed in the sample chamber between the sensing region and the dump region, and wherein
- the magnetic manipulator is positioned at a corner or side of the sample chamber and moves the magnetic particles diagonally away from the sensing region by simultaneously applying a vertical magnetic field and a lateral magnetic field gradient away from the sensing region.
A method for the detection of magnetic particles in a microelectronic sensor, comprising the following acts:
- a) providing a sample fluid containing the magnetic particles in a sample chamber of the microelectronic sensor;
- b) moving the magnetic particles with magnetic forces from a sensing region at the bottom of the sample chamber to a dump region disposed laterally with respect to the sensing region of the sample chamber, wherein the sensing region is separated from the dump region by a barrier element, and wherein magnetic particles cannot reach the sensing region from the dump region by sedimentation;
- and
- c) detecting magnetic particles in the sensing region, wherein the magnetic forces are generated by a magnetic manipulator positioned at a corner or wall of the sample chamber that moves the magnetic particles diagonally away from the sensing region by simultaneously applying a vertical magnetic field and a lateral magnetic field gradient away from the sensing region.
Dependencies are inferred from the claim text.