Concurrency test effectiveness via mutation testing and dynamic lock elision
AssigneeMicrosoft Corporation
InventorsChristopher William Dern, Roy Patrick Tan, Shaun Emory Miller
Life of this patent
Estimating the term…
Loading patent…
AssigneeMicrosoft Corporation
InventorsChristopher William Dern, Roy Patrick Tan, Shaun Emory Miller
Estimating the term…
One embodiment described herein is directed to a method practiced in a computing environment. The method includes acts for determining test suite effectiveness for testing for concurrency problems and/or product faults. The method includes identifying a plurality of synchronization primitives in a section of implementation source code. One or more of the synchronization primitives are iteratively modified and a same test suite is run for each iteration. For each iteration, a determination is made whether or not the test suite returns an error as a result of modifying one or more synchronization primitives. When the test suite does not return an error, the method includes providing to a user an indication which indicates at least one of a test adequacy hole for the test suite; an implementation source code fault; or an equivalent mutant of the implementation source code.
In a computing environment a method of determining test suite effectiveness for detecting concurrency problems and/or product faults within implementation source code, the method comprising:
A computer program product comprising physical storage media comprising computer executable instructions that when executed by one or more processors cause the one or more processors to perform the following:
A computer system comprising one or more processors and one or more computer memory comprising computer executable instructions that when executed by the one or more processors cause the one or more processors to perform the following:
Dependencies are inferred from the claim text.