US 8,275,568 B2Granted

Semiconductor test system with self-inspection of electrical channel

AssigneeKing Yuan Electronics Co., Ltd.

InventorChung Lung Chang

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Abstract

A semiconductor test system with self-inspection of an electrical channel is disclosed, which includes a tester head, a plurality of parameter detection units and a self-inspection controller. The tester head includes a plurality of pin electronics cards inserted therein, in which the plurality of pin electronics cards contain a plurality of power channels, a plurality of I/O channels and a plurality of drive channels. The self-inspection controller outputs different inspection signals respectively to each power channel, each I/O channel and each drive channel. Then, the plurality of parameter detection units detect response signals respectively produced by each power channel, each I/O channel and each drive channel in response to the inspection signals respectively received thereby, and the response signals are judged by the self-inspection controller. Thus, the invention is capable of self-inspecting each electrical channel if it is in a normal condition, either in an open or short circuit, or if there exists a leakage condition.

Claims10

Dependent claims

A semiconductor test system with self-inspection of an electrical channel, comprising:

a tester head, including a plurality of pin electronics cards (PE cards) inserted therein, the plurality of pin electronics cards containing a plurality of power channels, a plurality of I/O channels and a plurality of drive channels;
a plurality of parameter detection units, being respectively electrically connected to the plurality of power channels, the plurality of I/O channels and the plurality of drive channels in the plurality of pin electronics cards;
and
a self-inspection controller, being electrically connected respectively to the plurality of power channels, the plurality of I/O channels and the plurality of drive channels in the plurality of pin electronics cards, and to the plurality of parameter detection units, in which the self-inspection controller controls inputting different inspection signals respectively to each of the plurality of power channels, each of the plurality of I/O channels and each of the plurality of drive channels, and the plurality of parameter detection units detect response signals respectively produced by each of the plurality of power channels, each of the plurality of I/O channels and each of the plurality of drive channels in response to the inspection signals respectively received thereby and output the same to the self-inspection controller.

1 more element

Dependencies are inferred from the claim text.