Storage media defect detection
AssigneeLink—A—Media Devices Corporation
InventorsHaitao Xia, Yenyu Hsieh, Bac Pham
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Abstract
Detecting a defect on a storage device is disclosed. Detecting includes receiving a signal read from a storage device, sampling the signal to obtain a set of signal samples, wherein the sampling starts at an arbitrary time, computing a defect value for a defect type using the set of signal samples, comparing the defect value with a threshold associated with the defect type, determining whether there is a defect of the defect type based at least in part on the comparison, and in the event that a defect is detected, outputting an indication associated with the defect.
Claims20
A method, comprising:
- receiving a signal read from a storage device;
- sampling the signal with an arbitrary phase offset to obtain a set of signal samples, wherein the sampling starts at an arbitrary time;
- using a processor to compute an amplitude using the set of signal samples, wherein:
- the signal read from the storage device is associated with a sine waveform;
- and
- using the processor to compute includes computing a difference between a first sample and a third sample in a sequence of three samples to obtain a difference;
- comparing the amplitude with a threshold associated with an amplitude-related defect;
- determining whether the amplitude-related defect exists based at least in part on the comparison;
- and
- in the event it is determined that the amplitude-related defect exists, outputting an indication associated with the amplitude-related defect.
A system, comprising:
- a processor configured to:
- receive a signal read from a storage device;
- sample the signal with an arbitrary phase offset to obtain a set of signal samples, wherein the sampling starts at an arbitrary time;
- compute an amplitude using the set of signal samples, wherein:
- the signal read from the storage device is associated with a sine waveform;
- and
- computing includes computing a difference between a first sample and a third sample in a sequence of three samples to obtain a difference;
- compare the amplitude with a threshold associated with an amplitude-related defect;
- determine whether the amplitude-related defect exists based at least in part on the comparison;
- and
- in the event it is determined that the amplitude-related defect exists, output an indication associated with the amplitude-related defect;
- and
- a memory coupled with the processor, wherein the memory is configured to provide the processor with instructions.
A computer program product, the computer program product being embodied in a non-transitory computer readable medium and comprising computer instructions for:
- receiving a signal read from a storage device;
- sampling the signal with an arbitrary phase offset to obtain a set of signal samples, wherein the sampling starts at an arbitrary time;
- computing an amplitude using the set of signal samples, wherein:
- the signal read from the storage device is associated with a sine waveform;
- and
- computing includes computing a difference between a first sample and a third sample in a sequence of three samples to obtain a difference;
- comparing the amplitude with a threshold associated with an amplitude-related defect;
- determining whether the amplitude-related defect exists based at least in part on the comparison;
- and
- in the event it is determined that the amplitude-related defect exists, outputting an indication associated with the amplitude-related defect.
Dependencies are inferred from the claim text.