Semiconductor device and method for testing the same

A method for testing a semiconductor device comprising:

• writing data in a cell;
• activating a bit line equalization signal during a test mode period, and thus precharging a plurality of bit lines with a ground voltage level;
• activating a word line during the test mode period, and thus performing an active operation and a precharge operation;
• and
• if a read operation is started after the test mode period, detecting a leakage current fail of the plurality of bit lines.

A method for testing a semiconductor device comprising:

• writing first data in odd cells coupled to odd word lines;
• activating a bit line equalization signal during a first test mode period, and thus precharging a plurality of bit lines with a ground voltage level;
• activating all even word lines during the first test mode period, and thus performing an active operation and a precharge operation;
• detecting an electric potential of the pair of bit lines under a condition that the odd word lines are activated during a read operation after the first test mode period, and thus detecting a leakage current fail of the odd cells;
• writing second data in even cells coupled to even word lines;
• activating the bit line equalization signal during a second test mode period, and thus precharging the pair of bit lines with the ground voltage level;
• activating all odd word lines during the second test mode period, and thus performing the active operation and the precharge operation;
• and
• detecting an electric potential of the pair of bit lines under a condition that the even word lines are activated during a read operation after the second test mode period, and thus detecting a leakage current fail of the even cells.

A method for testing a semiconductor device comprising:

• preparing a semiconductor device having first binary information in a plurality of even word lines and having second binary information in a plurality of odd word lines;
• activating the plurality of even word lines and the plurality of odd word lines in response to an active command signal accompanying a test mode signal;
• and
• activating the plurality of even word lines and deactivating the plurality of odd word lines to read out the plurality of even word lines in response to the active command signal not accompanying the test mode signal.