Apparatus, system, and method for increasing measurement accuracy in a particle imaging device

A method for increasing the measurement accuracy in a particle measurement device comprising:

• measuring light emitted by a first particle;
• measuring light emitted by a second particle, where at least a portion of light emitted by the second particle is reflected off of the first particle;
• determining a contribution of light from the second particle that reflected off of the first particle;
• and
• discarding the measurement of the first particle if the contribution of light from the second particle that reflected off of the first particle is above a predetermined value.

A tangible computer-readable medium comprising computer readable code, that when executed by a computer, causes the computer to perform operations comprising:

• measuring light emitted by a first particle;
• measuring light emitted by a second particle, where the measured light from the second particle at least partially overlaps the measured light from the first particle in an overlap region;
• determining a contribution of light from the first particle in the overlap region;
• determining a contribution of light from the second particle in the overlap region;
• subtracting the contribution of light from the second particle from the contribution of light from the first particle;
• and
• determining the intensity of light emitted by the first particle.

An optical analysis system, comprising:

• a light detector configured to measure light emitted by a first particle and light emitted by a second particle, where the measured light from the second particle at least partially overlaps the measured light from the first particle in an overlap region;
• a processor coupled to the light detector, where the processor is configured to:
• determine a contribution of light from the first particle in the overlap region;
• determine a contribution of light from the second particle in the overlap region;
• subtract the contribution of light from the second particle from the contribution of light from the first particle;
• and
• determine the intensity of light emitted by the first particle.