On-chip accelerated failure indicator

A method of operating an accelerated failure indicator embedded on a semiconductor chip, the method comprising:

• determining an operating temperature of circuitry located outside of an insulating region, the insulating region comprising the accelerated failure indicator, on the semiconductor chip;
• heating a circuit located inside the insulating region of the accelerated failure indicator to a temperature higher than the determined operating temperature of the circuitry located outside of the insulating region;
• monitoring the heated circuit for degradation;
• and
• triggering an alarm in the event that the degradation of the heated circuit exceeds a predetermined threshold.

An electronics package comprising a semiconductor chip comprising an accelerated failure indicator, comprising:

• the accelerated failure indicator, the accelerated failure indicator being located on a first surface of the semiconductor chip, wherein the accelerated failure indicator comprises:
• an insulating region;
• a circuit located inside the insulating region;
• a heating element located inside the insulating region, the heating element configured to heat the circuit to a temperature higher than an operating temperature of the semiconductor chip;
• and
• a reliability monitor configured to monitor the circuit for degradation, and further configured to trigger an alarm in the event that the degradation of the circuit exceeds a predetermined threshold;
• a heat spreader, the heat spreader being connected to the semiconductor chip via a heat conducting compound, wherein the heat conducting compound is located on a second surface of the semiconductor chip, the second surface of the semiconductor chip being located on an opposite side of the semiconductor chip from the first surface of the semiconductor chip;
• and
• a void in the heat conducting compound located in an area on the second surface of the semiconductor chip opposite the location of the accelerated failure indicator on the first surface of the semiconductor chip.