Test apparatus and electronic device that tests a device under test
AssigneeAdvantest Corporation
InventorsMasayuki Kawabata, Toshiyuki Okayasu
Life of this patent
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Abstract
Provided is a test apparatus that tests a device under test, comprising a digital signal generator that outputs in parallel one or more n-bit digital test signals, where n is an integer greater than or equal to 1; a plurality of driver circuits that are connected respectively to a plurality of digital terminals of the device under test; and an analog signal generator that generates an analog test signal by converting, into an analog signal, an n×m-bit digital multi-bit signal based on the one or more digital test signals output by the digital signal generator to the plurality of driver circuits, where m is an integer greater than or equal to 2.
Claims18
A test apparatus that tests a device under test, comprising:
- a plurality of driver circuits that are connected respectively to a plurality of digital terminals of the device under test;
- a digital signal generator that outputs in parallel one or more n-bit digital test signals to the plurality of driver circuits, where n is an integer greater than or equal to 1;
- and
- an analog signal generator that generates an analog test signal by converting, into an analog signal, an n×m-bit digital multi-bit signal based on the one or more digital test signals output by the digital signal generator to the plurality of driver circuits, where m is an integer greater than or equal to 2.
An electronic device comprising:
- a plurality of driver circuits that are connected respectively to a plurality of digital terminals of a device under test;
- a digital signal generator that outputs in parallel one or more n-bit digital test signals to the plurality of driver circuits, where n is an integer greater than or equal to 1;
- and
- an analog signal generator that generates an analog test signal by converting, into an analog signal, a n×m-bit digital multi-bit signal based on the one or more digital test signals output by the digital signal generator to the plurality of driver circuits, where m is an integer greater than or equal to 2.
A test apparatus comprising:
- a plurality of comparators that receive signals output from digital terminals of a device under test and each output a comparison result between a voltage of the received signal and a prescribed threshold voltage;
- a plurality of digital signal comparing sections that each output comparison data obtained by comparing a respective comparison result to a prescribed expected value;
- and
- an analog signal receiver that (i) receives an analog signal output from an analog output terminal of the device under test, (ii) converts the analog signal into a k×m-bit digitally-converted signal, where k is an integer greater than or equal to 1, and (iii) where m is an integer greater than or equal to 2 inputs, to each of the plurality of digital signal comparing sections, divided data obtained by dividing the digitally-converted signal into m portions.
Dependencies are inferred from the claim text.