Scanning electron microscope having time constant measurement capability
AssigneeHitachi High-Technologies Corporation
InventorsAkira Ikegami, Hideyuki Kazumi, Koichiro Takeuchi, Atsushi Kobaru, Seiko Oomori
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Abstract
In a scanning electron microscope, an optimum scanning method for reducing the amount of deflection of a primary electron beam and secondary electrons is determined to acquire stable images. An energy filter is used to discriminate between energy levels. The change in yield of obtained electrons is used to measure the variation in specimen potential. The time constant of charging created during electron beam irradiation is extracted. The scanning method is optimized based on the extracted time constant to reduce the distortion and magnification variation that appear in a SEM image.
Claims5
A scanning electron microscope in which a specimen is irradiated with a primary electron beam to acquire an image of the specimen, the scanning electron microscope comprising:
- a deflector, which scans the specimen with the primary electron beam:
- an energy filter, which selectively permits electrons having more than a predetermined energy level among the electrons emitted from the specimen to pass;
- a detector, which outputs a detection signal based on the electrons that have passed through the energy filter;
- and
- a scanning order determination device, which determines a scanning order of a scanning line of the deflector, the scanning order being determined in response to a temporal change of an intensity of the detection signal outputted from the detector.
Dependencies are inferred from the claim text.