Methods of depositing a ruthenium film
AssigneeASM Genitech Korea Ltd.
InventorsJong Su Kim, Hyung Sang Park
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AssigneeASM Genitech Korea Ltd.
InventorsJong Su Kim, Hyung Sang Park
Estimating the term…
Cyclical methods of depositing a ruthenium layer on a substrate are provided. In one process, initial or incubation cycles include supplying alternately and/or simultaneously a ruthenium precursor and an oxygen-source gas to deposit ruthenium oxide on the substrate. The ruthenium oxide deposited on the substrate is reduced to ruthenium, thereby forming a ruthenium layer. The oxygen-source gas may be oxygen gas (O2). The ruthenium oxide may be reduced by supplying a reducing agent, such as ammonia (NH3) gas. The methods provide a ruthenium layer having good adherence to an underlying high dielectric layer while providing good step coverage over structures on the substrate. After nucleation, subsequent deposition cycles can be altered to optimize speed and/or conformality rather than adherence.
A method of depositing a ruthenium film, the method comprising:
A method of depositing a ruthenium film, the method comprising:
Dependencies are inferred from the claim text.