Method for acquiring overshoot voltage and analyzing degradation of a gate insulation using the same

An article of manufacture having a computer readable medium including data that, when accessed by a computer, cause the computer to acquire an overshoot voltage applied to a transistor, the acquiring comprising:

• determining a first extraction value, the first extraction value including a product of acceleration factors determined in a test of the transistor;
• determining an applied time, the applied time corresponding to a length of time a voltage deviates from a predetermined level of an input voltage in a circuit employing the transistor;
• determining a second extraction value by dividing the first extraction value by the applied time;
• and
• determining the overshoot voltage by multiplying the second extraction value by the input voltage.