Test mode soft reset circuitry and methods
AssigneeSanDisk Technologies LLC
InventorsBaojing Liu, Matt Davidson, Vladimir Kovalev
Life of this patent
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Abstract
A soft-function trigger state machine includes state machine logic defined to use a scan-in waveform to sample a scan-clock waveform to obtain a sampled data pattern. The state machine logic is defined to compare the sampled data pattern to a soft action pattern to determine whether the sampled data pattern matches the soft action pattern. The state machine logic is also defined to trigger an action associated with the soft action pattern when the sampled data pattern matches the soft action pattern.
Claims20
A soft-function trigger state machine, comprising:
- state machine circuitry defined to use a scan-in waveform to sample a scan-clock waveform to obtain a sampled data pattern, the state machine circuitry defined to compare the sampled data pattern to a soft action pattern to determine whether the sampled data pattern matches the soft action pattern, and the state machine circuitry defined to trigger an action associated with the soft action pattern when the sampled data pattern matches the soft action pattern.
A method for operating a reset state machine, comprising:
- simultaneously receiving a scan-in waveform and a scan-clock waveform;
- sampling the scan-clock waveform in accordance with a rising edge of the scan-in waveform;
- detecting a bit match when a certain bit pattern is observed from the sampled scan-clock waveform;
- and
- asserting a test mode soft reset signal in response to detecting the bit match.
Dependencies are inferred from the claim text.