Apparatus, method and program for distance measurement
AssigneeNEC Corporation
InventorRui Ishiyama
Life of this patent
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AssigneeNEC Corporation
InventorRui Ishiyama
Estimating the term…
A depth distance of a target point for measurement can be found by exploiting the equality of a cross ratio of phases of reference data points and a target point for measurement to a cross ratio of depth distances of these points. The depth distance of the target point for measurement can also be determined by exploiting the equality of a cross ratio of the distances among a set of projection points corresponding to projection of reference data points and a target point on a reference plane; of a cross ratio of distances among a set of image projection points corresponding to projection of a set of projection points on an image; and of a cross ratio of distances of a set of points which are equiphase to a set of image projection points on an arbitrary straight line on an image, respectively, relative to the cross ratio of the depth distances.
A distance measurement apparatus, in which a depth distance down to a target point is measured as a phase is entered to said apparatus as an input, said phase being a quantity representing a change of a pattern projected on a target point whose depth distance is to be measured;
A distance measurement apparatus in which a depth distance down to a target point is measured as a phase is entered to said apparatus as an input, said phase being a quantity representing a change of a pattern projected on a target point whose depth distance is to be measured;
A distance measurement apparatus, in which a depth distance down to a target point is measured as a phase is entered to said apparatus as input, said phase being a quantity representing a change of a pattern projected on a target point whose depth distance is to be measured;
A distance measurement method, in which a depth distance down to a target point is measured based on a phase which is a quantity representing a change of a pattern projected on a target point whose depth distance is to be measured;
A distance measurement method in which a depth distance down to a target point is measured based on a phase which is a quantity representing a change of a pattern projected on a target point whose depth distance is to be measured;
Dependencies are inferred from the claim text.