Electrooptic probe for vector measurement of an electromagnetic field

A device for measuring two components of an electromagnetic field in an analysis area, comprising:

• a light source for sending into a polarization-maintaining optical fiber a light beam polarized along axes of the fiber;
• an electro-optical material arranged in said area, said material being isotropic in the absence of an electromagnetic field and becoming anisotropic in the presence of an electromagnetic field, for receiving the light beam from the optical fiber via a substantially quarter-wave plate having its axes oriented at a substantially 45° angle with respect to the axes of the optical fiber and for sending back the beam into the fiber;
• a phase shifter for shifting the phase of the light beam sent back into the fiber, said phase shifter set to impose a phase shift equal and opposite to that imposed between the polarizations aligned along the axes of the fiber;
• and
• an analyzer for analyzing an orientation and an ellipticity of the light beam coming out of the phase shifter, the orientation and the ellipticity being respectively linked to the orientation and to the intensity of the electromagnetic field in the analysis area,
• wherein the analyzer comprises a second quarter-wave plate, a beam splitter, and first and second polarizers respectively arranged on first and second distinct paths between the beam splitter and first and second intensity detectors.

A method for using a device for measuring two components of an electromagnetic field in an analysis area, said device comprising:

• a light source for sending into a polarization-maintaining optical fiber a light beam polarized along axes of the fiber;
• an electro-optical material arranged in said area, said material being isotropic in the absence of an electromagnetic field and becoming anisotropic in the presence of an electromagnetic field, for receiving the light beam from the optical fiber via a substantially quarter-wave plate having its axes oriented at a substantially 45° angle with respect to the axes of the optical fiber and for sending back the light beam into the fiber;
• a phase shifter for shifting the phase of the light beam sent back into the fiber, said phase shifter set to impose a phase shift equal and opposite to that imposed between the polarizations aligned along the axes of the fiber;
• and
• an analyzer for analyzing an orientation and an ellipticity of the light beam coming out of the phase shifter, the orientation and the ellipticity being respectively linked to the orientation and to the intensity of the field in the analysis area;
• wherein said method comprises the steps of:
• arranging a polarizer behind the phase shifter at 45° with respect to the reference polarization defined by an axis of the fiber, and
• setting the phase shifter so that the polarizer transmits half of the light that it receives,
• wherein the substantially quarter-wave plate is defined as having a phase shift approaching but not equal to one quarter-wavelength.

A device for measuring two components of an electromagnetic field in an analysis area, comprising:

• a light source for sending into a polarization-maintaining optical fiber a light beam polarized along axes of the fiber;
• an electro-optical material arranged in said area, said material being isotropic in the absence of an electromagnetic field and becoming anisotropic in the presence of an electromagnetic field, for receiving the light beam from the optical fiber via a substantially quarter-wave plate having its axes oriented at a substantially 45° angle with respect to the axes of the optical fiber and for sending back the beam into the fiber;
• a phase shifter for shifting the phase of the light beam sent back into the fiber, said phase shifter set to impose a phase shift equal and opposite to that imposed between the polarizations aligned along the axes of the fiber;
• and
• an analyzer for analyzing an orientation and an ellipticity of the light beam coming out of the phase shifter, the orientation and the ellipticity being respectively linked to the orientation and to the intensity of the electromagnetic field in the analysis area,
• wherein the substantially quarter-wave plate has its axes oriented at substantially but not equal to a 45° angle.

A method for using a device for measuring two components of an electromagnetic field in an analysis area, said device comprising:

• a light source for sending into a polarization-maintaining optical fiber a light beam polarized along axes of the fiber;
• an electro-optical material arranged in said area, said material being isotropic in the absence of an electromagnetic field and becoming anisotropic in the presence of an electromagnetic field, for receiving the light beam from the optical fiber via a substantially quarter-wave plate having its axes oriented at a substantially 45° angle with respect to the axes of the optical fiber and for sending back the light beam into the fiber;
• a phase shifter for shifting the phase of the light beam sent back into the fiber, said phase shifter set to impose a phase shift equal and opposite to that imposed between the polarizations aligned along the axes of the fiber;
• and
• an analyzer for analyzing an orientation and an ellipticity of the light beam coming out of the phase shifter, the orientation and the ellipticity being respectively linked to the orientation and to the intensity of the field in the analysis area;
• wherein said method comprises the steps of:
• arranging a polarizer behind the phase shifter at 45° with respect to the reference polarization defined by an axis of the fiber, and
• setting the phase shifter so that the polarizer transmits half of the light that it receives,
• wherein the substantially quarter-wave plate has its axes oriented at substantially but not equal to a 45° angle.