Liquid crystal display device with data switching thin film transistor for inspection and inspection method thereof

An inspection method of a liquid crystal display device, the method comprising:

• forming a pixel matrix in which a plurality of gate lines and a plurality of data lines cross each other and a plurality of liquid crystal cells are arranged, first data switching thin film transistors respectively connected to a first group of the data lines, second data switching thin film transistors respectively connected to a second group of the data lines, a first external wire line connected to data input terminals of the first data switching thin film transistors, a second external wire line connected to data input terminals of the second data switching thin film transistors, a third external wire line connected to control terminals of the first and second data switching thin film transistors, a first external pad for supplying first data to the first external wire line, a second external pad for supplying second data to the second external wire line, and a third external pad for supplying control data to the third external wire line;
• connecting a gate drive circuit for supplying a scan pulse to the gate lines;
• and
• supplying the first and second data to the external pads to display a window pattern on the pixel matrix and judging whether there is a cross-talk defect,
• wherein the first group of data lines comprises a bunch of adjacent data lines in the middle of the pixel matrix, and
• wherein the second group of data lines comprises two bunches of adjacent data lines on either sides of the first group of data lines.