Successive approximation analog-to-digital converter

A method for testing the operation of an analog-to-digital converter, the method comprising:

• a first phase and a second phase, the first phase including:
• a) receiving a signal indicating a test mode operation;
• b) generating a configuration signal;
• c) generating a first analog value according to the configuration signal;
• the second phase including:
• d) generating a control signal;
• e) generating a second analog value according to the control signal;
• f) comparing the first analog value with respect to the second analog value and generating therefrom a digital value according to a successive-approximation algorithm;
• g) receiving the digital value and generating therefrom the control signal for controlling the generation of the second analog value according to the successive-approximation algorithm;
• and
• h) generating, from the digital value, an alarm signal indicating a failure within the analog-to-digital converter or indicating a degradation of the performance of the analog-to-digital converter.

An integrated circuit comprising:

• an analog-to-digital converter that includes:
• a first generator configured to generate a first analog value according to a configuration signal when the analog-to-digital converter is operating in a first phase of a test mode;
• a digital-to-analog converter adapted to generate a second analog value according to a control signal when the analog-to-digital converter is operating in a second phase of the test mode;
• a second generator that configured to generate a digital value from the comparison of the first analog value with respect to the second analog value according to a successive-approximation algorithm when the analog-to-digital converter is operating in the second phase of the test mode;
• and
• a controller adapted to receive a signal indicating the test mode, and adapted to:
• generate in the first phase the configuration signal;
• receive in the second phase the digital value and generate therefrom the control signal for controlling the generation of the second analog value according to the successive-approximation algorithm;
• and
• generate, from the digital value, an alarm signal indicating a failure within the analog-to-digital converter or indicating a degradation of the performance of the analog-to-digital converter.

An electronic system comprising:

• an analog-to-digital converter that includes:
• a first generator configured to generate a first analog value according to a configuration signal when the analog-to-digital converter is operating in a first phase of a test mode;
• a digital-to-analog converter adapted to generate a second analog value according to a control signal when the analog-to-digital converter is operating in a second phase of the test mode;
• a second generator configured to generate a digital value from the comparison of the first analog value with respect to the second analog value according to a successive-approximation algorithm when the analog-to-digital converter is operating in the second phase of the test mode;
• and
• a controller adapted to receive a signal indicating the test mode, and adapted to:
• generate in the first phase the configuration signal;
• receive in the second phase the digital value and generate therefrom the control signal for controlling the generation of the second analog value according to the successive-approximation algorithm;
• and
• generate, from the digital value, an alarm signal indicating a failure within the analog-to-digital converter or indicating a degradation of the performance of the analog-to-digital converter;
• and
• a micro-processor adapted to compare the digital value with respect to a range of values and to generate therefrom the alarm signal indicating the failure or the degradation, in case the digital value is out of the range.