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US 8,264,287 B2Granted
Method, apparatus, and system for measuring analog voltages on die
AssigneeIntel Corporation
InventorAtul Maheshwari
Life of this patent
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Abstract
An analog-to-digital converter (ADC) suitable for measuring on-die DC or low frequency analog voltages may include a ring oscillator having a group of circuit cells successively and circularly coupled. Under certain circumstances, the ring oscillator may produce an output frequency that corresponds substantially linear to the input voltage. Other embodiments may be disclosed or claimed.
Claims9
An apparatus comprising:
- an input terminal configured to accept an input voltage;
- a ring oscillator to generate an output frequency based on the input voltage, the ring oscillator including a group of circuit cells coupled successively and circularly, wherein each one of the group of circuit cells includes pull-up transistor and a pull-down transistor, each pull-up transistor being configured to conduct more current than each pull-down transistor, wherein the input terminal is coupled to gate terminals of at least two pull-down transistors of the group of circuit cells to control the output frequency;
- and
- a counter to generate a symbol representing the input voltage based on the output frequency.
1 more element
Dependencies are inferred from the claim text.