Array substrate having increased inspection efficiency and display apparatus having the same
AssigneeSamsung Electronics Co., Ltd.
InventorsSung-Man Kim, Myung-Koo Hur, Beom-Jun Kim, Seong-Young Lee
Life of this patent
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Abstract
In an array substrate and a display apparatus, a pixel part has a plurality of gate lines, a plurality of data lines, and a plurality of pixels electrically connected to the gate and data lines. A driving circuit drives the pixel part electrically connected to a first end of the gate lines. An inspection circuit is electrically connected to a second end of the gate lines, and inspects the pixel part in response to an inspection signal externally provided. Thus, positions and causes for defects of the pixel part may be accurately detected, thereby improving inspecting efficiency.
Claims13
A method of inspecting an array substrate that includes a pixel part disposed in a pixel area and a driving circuit disposed in a first peripheral area adjacent to a first side of the pixel area, the method comprising:
- applying a first inspection voltage to odd-numbered gate lines through a first inspection line of an inspection circuit during a first inspection time, the inspection circuit being disposed in a second peripheral area adjacent to a second side of the pixel area, which is opposite to the first side with respect to the pixel area;
- applying a second inspection voltage to even-numbered gate lines through a second inspection line of the inspection circuit during the first inspection time;
- applying the second inspection voltage to the odd-numbered gate lines through the first inspection line during a second inspection time;
- and
- applying the first inspection voltage to the even-numbered gate lines through the second inspection line during the second inspection time,
- wherein the inspection circuit further includes a third inspection line receiving the first inspection voltage during both the first inspection time and the second inspection time,
- the first inspection line is connected exclusively to the odd-numbered gate lines among the gate lines,
- the second inspection line is connected exclusively to the even-numbered gate lines among the gate lines, and
- an even-numbered gate line among the even-numbered gate lines is disposed between each pair of consecutively numbered odd-numbered gate lines among the odd-numbered gate lines.
Dependencies are inferred from the claim text.