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US 8,264,249 B2Granted
Vertical probe card
AssigneeChunghwa Precision Test Tech. Co., Ltd.
InventorsWen-Tsung Lee, Kuan-Chun Tseng
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Abstract
The present invention provides on IC test substrate for testing various signals, a combined flexible and rigid PCB included in the structure is applicable to perform a mission including for example: stabilizing power input/output, signal transfer by a connector; general, power, and high frequency signal transmission in preserved integrity state.
Claims13
A vertical probe card, comprising:
- a probe printed circuit board (PCB) having a first surface and an opposite second surface,
- wherein a slot is formed in the probe PCB providing passage from the first surface to the second surface;
- an integrated circuit (IC) test substrate disposed on the first surface of the probe PCB;
- and
- a flexible PCB having a first end portion, an extended portion, a penetrating portion, and a second end portion arranged in sequence,
- wherein the first end portion is connected to the IC test substrate, the penetrating portion passes through the slot of the probe PCB, and the second end portion is exposed from the second surface of the probe PCB.
3 more elements
Dependencies are inferred from the claim text.