Back to results
US 8,264,236 B2Granted
System and method for electronic testing of devices
AssigneeAdvantest (Singapore) Pte Ltd
InventorsJose Moreira, Markus Rottacker
Life of this patent
Estimating the term…
Abstract
A method for testing electronic devices involves receiving a stimulus signal for testing a device; changing an operating temperature of at least a component of an electrical filter while maintaining settings of the electrical filter, thereby altering the stimulus signal as the stimulus signal passes through the electrical filter, to create an altered stimulus signal; and outputting the altered stimulus signal.
Claims21
A method, comprising:
- receiving at an electrical filter a stimulus signal for testing a device;
- changing an operating temperature of at least a component of the electrical filter while maintaining settings of the electrical filter, thereby altering the stimulus signal as the stimulus signal passes through the electrical filter, to create an altered stimulus signal;
- and
- outputting the altered stimulus signal.
1 more element
An electrical filter, comprising:
- an input port receiving a stimulus signal for testing a device;
- an alteration device for changing an operating temperature of at least a component of the electrical filter while maintaining settings of the electrical filter, the electrical filter altering the stimulus signal based on the operating temperature of at least the component, and the settings, to create an altered stimulus signal;
- and
- an output port outputting the altered stimulus signal to the device.
1 more element
A system, comprising:
- an automatic test equipment device generating a stimulus signal;
- and
- an electrical filter including an input port to receive the stimulus signal, an alteration device to change an operating temperature of at least a component of the electrical filter while maintaining settings of the electrical filter, the electrical filter altering the stimulus signal based on the operating temperature of at least the component, and the settings, to create an altered stimulus signal, and an output port to output the altered stimulus signal to test a device.
Dependencies are inferred from the claim text.