Method for analyzing gait pattern
AssigneeElectronics and Telecommunications Research Institute
InventorsMin Ho Kim, Ho Youl Jung, Jae Won Jang, Sa Kwang Song, Soo Jun Park
Life of this patent
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Abstract
A method for analyzing a gait pattern includes: measuring, by a plurality of force sensing resistor (FSR) sensors, foot pressure values, and outputting the measured foot pressure values, respectively; searching for a maximum pressure local area in which the sum of the output values from the FSR sensors included in each of a plurality of pressure local areas is maximized; calculating a center of pressure (COP) with respect to the detected maximum pressure local area; and analyzing a gait pattern by adding the calculated COP to the trajectory of COPs.
Claims5
A method for analyzing a gait pattern, the method comprising:
- measuring, by a plurality of force sensing resistor (FSR) sensors, foot pressure values, and outputting the measured foot pressure values, respectively;
- searching for a maximum pressure local area at which the sum of the output values from the FSR sensors included in each of a plurality of pressure local areas is maximized;
- calculating a center of pressure (COP) with respect to the detected maximum pressure local area;
- and
- analyzing a gait pattern by adding the calculated COP to the trajectory of COPs.
Dependencies are inferred from the claim text.