Method for analyzing a scratch test
AssigneeCSM Instruments SA
InventorsPierre-Jean Coudert, Bertrand Bellaton
Life of this patent
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AssigneeCSM Instruments SA
InventorsPierre-Jean Coudert, Bertrand Bellaton
Estimating the term…
A method for analyzing a scratch from a scratch test includes (a) locating the beginning of the scratch relative to a reference position, (b) making the scratch on a bulk with an indenter while recording the applied force and at least one measurement parameter, as a function of the displacement of the indenter relative to the reference position, (c) acquiring and recording images of the scratch relative to the reference position, (d) synchronizing the recorded images, the applied force and the measurement parameter, as a function of the displacement of the indenter, (e) displaying curves of the applied force and of the measurement parameter as a function of the displacement of the indenter, and (f) displaying in a synchronized way an image of the scratch reconstructed from the recorded images.
A method for analyzing a scratch from a scratch test, implementing a digital image acquisition device provided with a high magnification objective able to shoot only a part of the scratch, a bulk and an indenter for applying a force on the bulk, said method comprising the following steps:
Dependencies are inferred from the claim text.