System and method for 3D measurement and surface reconstruction
AssigneeCity University of Hong Kong
InventorsYou Fu Li, Sheng Yong Chen
Life of this patent
Estimating the term…
Abstract
A system and method for measuring and surface reconstruction of a 3D image of an object comprises a projector arranged to project a pattern onto a surface of an object to be imaged; and a processor stage arranged to examine distortion or distortions produced in the pattern by the surface. The processor stage is arranged to convert by, for example, a triangulation process the distortion or distortions produced in the pattern by the surface to a distance representation representative of the shape of the surface. The processor stage is also arranged to reconstruct electronically the surface shape of the object.
Claims36
A method for measuring and surface reconstruction of a 3D image of an object comprising:
- projecting a pattern onto a surface of an object to be imaged, wherein the step of projecting a pattern comprises projecting a colour-coded array pattern onto a surface of an object to be imaged;
- and wherein the step of projecting a pattern comprises projecting using a projector;
- viewing using a camera said pattern projected onto said surface and passing one or more signals from said camera representative of said pattern to said processing stage;
- arranging said camera and said projector to have 6 degrees of freedom relative to each other;
- examining in a processor stage distortion or distortions produced in said pattern by said surface;
- converting in said processor stage said distortion or distortions produced in said pattern by said surface to a distance representation representative of the shape of the surface;
- and
- reconstructing electronically said surface shape of said object;
- slicing in said processor stage said pattern as distorted by said surface into a number of cross section curves;
- reconstructing one or more of said cross-section curves by a closed B-spline curve technique;
- selecting a control point number of a plurality of B-spline models from said one or more curves;
- determining using entropy techniques representation of uncertainty in said selected plurality of B-spline models to predict an information gain for each cross section curve;
- mapping said information gain of said plurality of B-spline models into a view space;
- and
- selecting as a Next Best View a view point in said view space containing a maximum information gain for said object.
A system for measuring and surface reconstruction of a 3D image of an object comprising:
- a projector arranged to project a pattern onto a surface of an object to be imaged, wherein said pattern comprises a colour-coded array pattern;
- a camera arranged to view said pattern projected onto said surface;
- said camera being arranged to pass one or more signals representative of said pattern to said processor, wherein said projector and said camera are arranged to have 6 degrees of freedom relative to each other;
- a processor stage arranged to examine distortion or distortions produced in said pattern by said surface;
- said processor stage further being arranged to convert said distortion or distortions produced in said pattern by said surface to a distance representation representative of the shape of the surface;
- and
- said processor stage being arranged to reconstruct electronically said surface shape of said object;
- slice said processor stage said pattern as distorted by said surface into a number of cross section curves;
- reconstruct one or more of said cross-section curves by a closed B-spline curve technique;
- select a control point number of a plurality of B-spline models from said one or more curves;
- determine using entropy techniques representation of uncertainty in said selected plurality of B-spline models to predict an information gain for each cross section curve;
- map said information gain of said plurality of B-spline models into a view space;
- and
- select as a Next Best View a view point in said view space containing a maximum information gain for said object.
Dependencies are inferred from the claim text.