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US 8,208,698 B2Granted
Characterizing a texture of an image
AssigneeMELA Sciences, Inc.
InventorAlexandru Bogdan
Life of this patent
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Abstract
Among other things, a texture of an image is characterized by deriving lacunarity measures from the image based on a wavelet analysis.
Claims54
A machine-based method comprising:
- analyzing wavelet maxima in a wavelet maxima representation of an image;
- and
- characterizing a texture of the image by deriving lacunarity measures based on the analysis of the wavelet maxima.
A non-transitory computer-readable medium having encoded thereon instructions for performing operations comprising:
- analyzing wavelet maxima in a wavelet maxima representation of an image;
- and
- characterizing a texture of the image by deriving lacunarity measures based on the analysis of the wavelet maxima.
A machine comprising:
- a processor;
- a storage device that stores a program for execution by the processor, the program comprising instructions for causing the processor to
- analyze wavelet maxima in a wavelet maxima representation of an image;
- and
- characterize a texture of the image by deriving lacunarity measures based on the analysis of the wavelet maxima.
2 more elements
Dependencies are inferred from the claim text.