Method for fabricating LED chip comprising reduced mask count and lift-off processing
AssigneeLextar Electronics Corporation
InventorsKuo-Lung Fang, Chien-Sen Weng, Chih-Wei Chao
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Abstract
A method for fabricating a light emitting diode chip is provided. In the method, a half-tone mask process, a gray-tone mask process or a multi-tone mask process is applied and combined with a lift-off process to further reduce process steps of the light emitting diode chip. In the present invention, some components may also be simultaneously formed by an identical process to reduce the process steps of the light emitting diode chip. Consequently, the fabricating method of the light emitting diode provided in the present invention reduces the cost and time for the fabrication of the light emitting diode.
Claims7
A method for fabricating a light emitting diode chip, comprising:
- forming a semiconductor layer and a conductive layer sequentially on a substrate, wherein a first type semiconductor material layer, a light emitting material layer and a second type semiconductor material layer form the semiconductor layer;
- forming a first patterned photoresist layer on the conductive layer, wherein the first patterned photoresist layer comprises a first photoresist block and a second photoresist block, and a thickness of the first photoresist block is thinner than a thickness of the second photoresist block;
- removing a portion of the conductive layer and a portion of the semiconductor layer with the first patterned photoresist layer as a mask to form a semiconductor device layer;
- reducing a thickness of the first patterned photoresist layer until the first photoresist block is removed completely and using the remaining second photoresist block as a mask to partially remove the conductive layer to form a current spreading layer, wherein the current spreading layer partially exposes the semiconductor device layer;
- removing the remaining second photoresist block;
- and
- forming a patterned dielectric layer and a plurality of electrodes on the current spreading layer and the semiconductor device layer.
Dependencies are inferred from the claim text.