Method and system for interrogating the thickness of a carbon layer
AssigneeWestern Digital (Fremont), LLC
InventorTerrance J. Willis
Life of this patent
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Abstract
A method and system for interrogating a thickness of a carbon layer are described. The carbon layer resides on at least one of a magnetic recording head and a magnetic recording disk. The method and system include providing an enhancement film on the carbon layer. The enhancement film is continuous across a portion of the carbon layer. The method and system also include exposing the enhancement film to light from a light source and detecting scattered light from the carbon layer to provide a surface enhanced Raman spectroscopy (SERS) spectrum. The enhancement film resides between the light source and the carbon layer. The method and system also include determining the thickness of the carbon layer based on the SERS spectrum.
Claims19
A method for interrogating a thickness of a carbon layer residing on at least one of a magnetic recording head and a magnetic recording disk, the method comprising:
- providing an enhancement film on the carbon layer, the enhancement film being continuous across a portion of the carbon layer;
- exposing the enhancement film to light from a light source, the enhancement film residing between the light source and the carbon layer;
- detecting scattered light from the carbon layer to provide a surface enhanced Raman spectroscopy (SERS) spectrum;
- and
- determining the thickness of the carbon layer based on the SERS spectrum.
A method for interrogating a thickness of a carbon overcoat layer residing on at least one of a slider and a magnetic recording disk, the carbon overcoat layer having a thickness of not more than twenty-five Angstroms, the method comprising:
- providing an enhancement film on the carbon overcoat layer, the enhancement film being continuous across a portion of the carbon overcoat layer and having a thickness of not more than twelve nanometers and not less than five nanometers, the enhancement film including at least one of Au, Ag, Pd, Rh, Li, Na, and Pt;
- exposing the enhancement film to light from a laser, the enhancement film residing between the laser and the carbon overcoat layer, the intensity of the light incident on the enhancement film being insufficient to melt the enhancement film during the exposing;
- detecting scattered light from the carbon overcoat layer to provide a surface enhanced Raman spectroscopy (SERS) spectrum;
- and
- determining the thickness of the carbon overcoat layer based on the SERS spectrum.
A method for interrogating a thickness of a carbon layer residing on at least one of a slider and a magnetic recording disk, the carbon layer having a thickness of not more than twenty-five Angstroms, the method comprising:
- providing an enhancement film on the carbon layer, the enhancement film being continuous across a portion of the carbon layer and including at least one of Au, Ag, Pd, Rh, Li, Na, and Pt;
- performing surface enhanced Raman spectroscopy (SERS) on the carbon layer using a light source, the enhancement film residing between the carbon layer and the light source;
- determining the thickness of the carbon layer based on the SERS.
Dependencies are inferred from the claim text.