Structures for semiconductor structures with error detection and correction

A design structure comprising a semiconductor structure in a format of a text file or a graphical representation of the semiconductor structure, the design structure stored in a machine readable physically tangible storage device, the design structure being a component of a system configured to design, manufacture, or test the semiconductor structure, the semiconductor structure comprising:

• (a) a first semiconductor chip, a second semiconductor chip, and a first error checking layer,
• wherein the first error checking layer is sandwiched between and bonded to the first and second semiconductor chips,
• wherein the first semiconductor chip comprises a first electric node,
• wherein the second semiconductor chip comprises a second electric node, wherein
• the first error checking layer comprises a first comparing circuit;
• (b) a first coupling via electrically connecting the first electric node of the first semiconductor chip to the first comparing circuit of the first error checking layer;
• and
• (c) a second coupling via electrically connecting the second electric node of the second semiconductor chip to the first comparing circuit of the first error checking layer,
• wherein the first comparing circuit is capable of:
• (i) receiving an input signal from the first electric node indirectly through the first coupling via,
• (ii) receiving an input signal from the second electric node indirectly through the second coupling via, and
• (iii) asserting a first mismatch signal in response to the input signals from the first and second electric nodes being different.