Test apparatus for testing a device under test and device for receiving a signal
AssigneeAdvantest Corporation
InventorsKenichi Nagatani, Atsuo Sawara, Hiroshi Nakagawa
Life of this patent
Estimating the term…
Abstract
A test apparatus for testing a device under test includes a capture memory that stores thereon an output pattern received from the device under test, a header detecting section that reads the output pattern from the capture memory and detects a portion matching a predetermined header pattern in the output pattern, and a judging section that judges whether the output pattern is acceptable based on a result of comparison between a pattern, in the output pattern, which starts with the portion matching the predetermined header pattern and a corresponding expected value pattern.
Claims20
A test apparatus for testing a device under test, comprising:
- a performance board on which the device under test is placed;
- an additional board configured to be added to the performance board,
- a capture memory, provided on the additional board, that stores thereon an output pattern received from the device under test in accordance with a first reference clock signal input to the additional board and;
- a header detecting section, provided on the additional board, that reads the output pattern from the capture memory in accordance with a second reference clock signal input to the additional board, detects a portion matching a predetermined header pattern in the output pattern, and outputs the output pattern, the first reference clock signal being a higher speed clock signal than the second reference clock signal;
- and
- a judging section provided outside the additional board that receives the output pattern that is output from the header detecting section, judges whether the output pattern is acceptable based on a result of comparison between a pattern, in the output pattern, which starts with the portion matching the predetermined header pattern and a corresponding expected value pattern.
A device including therein a receiving section that receives a signal output from a different device, the receiving section comprising:
- a differential comparator that outputs a reception signal determined by a difference between a signal input via a positive input and a signal input via a negative input;
- and
- a switching section that receives the signal output from the different device and that inputs a signal in the positive input of the differential comparator and a signal in the negative input of the differential comparator, wherein
- the switching section comprises:
- a first switch that is provided on a positive signal transmission line and that connects or disconnects the positive input of the differential comparator to the different device;
- a second switch that is provided on a negative signal transmission line and that connects or disconnects the negative input of the differential comparator to the different device;
- a third switch that connects or disconnects the positive input of the differential comparator and a first threshold voltage;
- and
- a fourth switch that connects or disconnects the negative input of the differential comparator and a second threshold voltage.
A test apparatus for testing a device under test, comprising:
- a test signal supply section that supplies a test signal to the device under test;
- a receiving section that receives an output signal output from the device under test in response to the test signal;
- and
- a judging section that judges whether the output signal received by the receiving section is acceptable, wherein the receiving section includes:
- a differential comparator that outputs a reception signal determined by a difference between a signal input via a positive input and a signal input via a negative input;
- and
- a switching section that receives the signal output from the device under test and that inputs a signal in the positive input of the differential comparator and a signal in the negative input of the differential comparator, wherein
- the switching section comprises:
- a first switch that is provided on a positive signal transmission line and that connects or disconnects the positive input of the differential comparator to the device under test;
- a second switch that is provided on a negative signal transmission line and that connects or disconnects the negative input of the differential comparator to the device under test;
- a third switch that connects or disconnects the positive input of the differential comparator and a first threshold voltage;
- and
- a fourth switch that connects or disconnects the negative input of the differential comparator and a second threshold voltage.
Dependencies are inferred from the claim text.