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US 8,138,783 B2Granted
Testable integrated circuit and IC test method
AssigneeNXP B.V.
InventorsJosep Rius Vazquez, Luis Elvira Villagra, Rinze I. M. P. Meijer
Life of this patent
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AssigneeNXP B.V.
InventorsJosep Rius Vazquez, Luis Elvira Villagra, Rinze I. M. P. Meijer
Estimating the term…
A circuit portion (100) of an IC comprises a plurality of conductive tracks (130) for coupling respective circuit portion elements (150), e.g. standard logic cells, to a power supply rail (110), with the conductive tracks (130) being coupled to the power supply rail (110) via at least one enable switch (132). The circuit portion (100) further comprising an element (160) for determining a voltage gradient over the circuit portion (100) in a test mode of the integrated circuit (600), which is conductively coupled to the conductive tracks (130). The element (160) has a first end portion (164) for coupling the element (160) to the power supply terminal and a second end portion (166) for coupling the element (160) to the output (620) in the test mode. This facilitates IDDQ testing of the circuit portion (100) by means of measuring a voltage gradient over the element (160).
An integrated circuit having a power supply terminal, an output and a circuit portion comprising a plurality of conductive tracks for coupling respective circuit portion elements to a power supply rail, the conductive tracks being coupled to the power supply rail via at least one enable switch, the circuit portion further comprising an element for determining a voltage gradient over the circuit portion in a test mode of the integrated circuit, the element being conductively coupled to the conductive tracks, the element having a first end portion for coupling the element to the power supply terminal and a second end portion for coupling the element to the output in said test mode.
Dependencies are inferred from the claim text.