Handler for electronic components, in particular IC's, comprising circulating units, the temperature of which can be controlled
AssigneeMultitest Elektronische Systeme GmbH
InventorsStefan Thiel, Franz Pichl, Günther Jeserer, Andreas Wiesböck
Life of this patent
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Abstract
A handler for electronic components, in particular IC's, for controlling the temperature of the components and supplying and removing said components to and from a test device has circulating units that can be moved along a circulating track. Each unit has at least one retaining unit for retaining a component. In addition, the circulating units have temperature-control chambers containing components that are retained by the retaining units, so that the temperature of the components can be controlled during transport from the charging station to the test station.
Claims19
A handler for electronic components such as ICs, comprising
- a plurality of circulating units which can be moved on a circulating path and each have at least one retaining unit for retaining a component and can be moved between a loading station for loading the retaining units with the components,
- a test station for supplying the components to contacting means connected to a test device and an unloading station for removing the components from the retaining units,
- a drive means for moving the circulating units,
- wherein the circulating units each have at least one temperature control chamber containing the components mounted to the retaining units, so that the temperature of the components can be controlled during transportation from the loading station to the test station,
- wherein the circulating units having temperature control chambers can be moved independently of one another on the circular path.
A handler for electronic components such as ICS, comprising
- plural circulating units movable on a circulating path and each comprising at least one retaining unit structured to retain a component and to be movable between a loading station for loading the retaining units with the components,
- a test station structured to supply the components to a contacting arrangement connected to a test device and an unloading station that removes the components from the retaining units,
- a drive device coupled to move the plural circulating units,
- wherein the circulating units each have at least one temperature control chamber containing the components mounted to the retaining units, so that the temperature of the components can be controlled during transportation from the loading station to the test station,
- wherein the circulating units having temperature control chambers can be moved independently of one another on the circular path.
A handler for electronic components such as ICs, comprising
- plural circulating units movable on a circulating path and each comprising at least one retaining unit structured to retain a component and to be movable between a loading station for loading the retaining units with the components,
- a test station structured to supply the components to a contacting arrangement connected to a test device and an unloading station that removes the components from the retaining units,
- a drive device coupled to move the plural circulating units,
- wherein the circulating units each have at least one temperature control chamber containing the components mounted to the retaining units, so that the temperature of the components can be controlled during transportation from the loading station to the test station,
- wherein the drive device has, for moving the circulating units, a plurality of drive motors, each circulating unit being operatively connected to its own drive motor.
Dependencies are inferred from the claim text.