Loading patent…
AssigneePanasonic Corporation
InventorsHajime Nishino, Kenichi Suzuki, Shinji Kasamatsu, Masato Fujikawa, Mikinari Shimada
Estimating the term…
The present invention relates to an internal short circuit evaluation method for a battery including an electrode group including a positive electrode plate, a negative electrode plate and a separator disposed between the positive electrode plate and the negative electrode plate, and an outer jacket covering the electrode group, the method including the steps of: (I) processing the electrode group to a predetermined position of the electrode group, from the outside of the electrode group toward the inside thereof; and (II) causing a short circuit between a portion of the electrode plate and a portion of the negative electrode plate of the electrode group that are located inside from the predetermined position, and measuring battery information that is changed by the short circuit, and an evaluation apparatus used for the above-described method.
An internal short circuit evaluation method for a battery, the battery comprising an electrode group which is a stacked body including a positive electrode plate, a negative electrode plate wound with a separator interposed between said positive electrode plate and said negative electrode plate, said method comprising steps of:
The internal short circuit evaluation method in accordance with wherein, in said step (II), said cutting or abrasion is performed without causing a continuous short circuit.
An internal short circuit evaluation apparatus for a battery, the battery comprising an electrode group which is a stacked body including a positive electrode plate, a negative electrode plate wound with a separator interposed between said positive electrode plate and said negative electrode plate, said apparatus comprising:
Dependencies are inferred from the claim text.