Method and system for incorporation of patterns and design rule checking

A computer-implemented method for designing a physical layout for an Integrated Circuit (IC), comprising:

• using a computing system which comprises at least one processor to perform a process, the process comprising
• receiving an IC design that specifies a desired function;
• consulting an application-specific pattern library containing a known bad pattern that corresponds to one or more patterns in the IC design and statistical information;
• performing statistical analysis based at least in part upon the known bad pattern and the statistical information associated with a probability that the known bad pattern will properly perform the desired function after manufacturing to generate a result to determine whether the IC design is suitable for manufacturing, wherein the act of performing statistical analysis determines an impact on a component in the IC design caused by at least one non-neighboring circuit component, which is not neighboring the component and comprises:
• producing a physical layout based at least in part upon the result of the statistical analysis of the IC design, wherein the physical layout does not include the known bad pattern, and the known bad pattern is based at least in part upon one or more criteria specific to the desired function;
• and
• storing the physical layout in a volatile or non-volatile computer-usable medium or displaying the physical layout on a display device.

A system for analyzing suitability of an Integrated Circuit (IC) layout for manufacture, comprising:

• a computer system that comprises at least one processor and is configured for performing:
• receiving an IC layout;
• performing design rules checking (DRC) using design rules on the IC layout to generate a DRC result;
• consulting a pattern library, wherein
• the pattern library comprises at least a pattern that corresponds to one or more patterns in the IC layout and statistics associated with a probability that the pattern will function as designed after manufacturing;
• analyzing the IC layout based at least in part upon the DRC result and the pattern to determine one or more exceptions to the design rules, wherein
• the act of analyzing the IC layout comprises determining an impact on a component of the IC layout caused by at least one non-neighboring circuit component, which is not neighboring the component;
• and
• making a determination, based at least in part upon the means for analyzing the IC layout and the pattern, of the suitability of the IC layout for manufacture, wherein the means for making the determination comprises:
• performing statistical analysis by using at least in part the one or more exceptions to the design rules and the statistics from the pattern library associated with the probability that the pattern will function as designed after manufacturing to determine whether the manufactured IC layout is suitable for manufacturing.

A computer program module comprising a non-transitory computer-usable medium storing a computer program comprising instructions which, when executed by a processor, cause the processor to perform a process for analyzing suitability of an Integrated Circuit (IC) layout for manufacture, the process comprising:

• receiving an IC layout;
• performing design rules checking (DRC) using design rules on the IC layout to generate a DRC result;
• consulting a pattern library, wherein
• the pattern library comprises at least a pattern that corresponds to one or more patterns in the IC layout and statistics associated with a probability that the pattern will function as designed after manufacturing;
• analyzing the IC layout based at least in part upon the DRC result and the pattern to determine one or more exceptions to the design rules, wherein
• the act of analyzing the IC layout comprises determining an impact on a component in the IC layout caused by at least one non-neighboring circuit component, which is not neighboring the component;
• and
• making a determination, based at least in part upon the act of analyzing the IC layout and the pattern, of the suitability of the IC layout for manufacture, wherein the act of making the determination comprises:
• performing statistical analysis by using at least in part the one or more exceptions- and the statistics to determine whether the manufactured IC layout is suitable for manufacturing.

A system for designing a physical layout for an Integrated Circuit (IC), comprising:

• A computer system that comprises at least one processor and is configured for performing:
• receiving an IC design that specifies a desired function;
• consulting an application-specific pattern library containing a known bad pattern that corresponds to one or more patterns in the IC design and statistical information;
• performing statistical analysis based at least in part upon the known bad pattern and the statistical information associated with a probability that the known bad pattern will properly perform the desired function after manufacturing to generate a result to determine whether the IC design is suitable for manufacturing, wherein the processor configured for performing the statistical analysis is further configured for determining an impact on a component in the IC design caused by at least one non-neighboring circuit component, which is not neighboring the component;
• and
• producing a physical layout based at least in part upon the result of the statistical analysis of the IC design, wherein
• the physical layout does not include the known bad pattern, and the known bad pattern is based at least in part upon one or more criteria specific to the desired function.

A computer program module comprising a non-transitory computer-usable medium storing a computer program comprising instructions which, when executed by a processor, cause the processor to perform a method, the method comprising:

• receiving an IC design that specifies a desired function;
• consulting an application-specific pattern library containing a known bad pattern that corresponds to one or more patterns in the IC design and statistical information;
• performing statistical analysis based at least in part upon the known bad pattern and the statistical information associated with a probability that the known bad pattern will properly perform the desired function after manufacturing to generate a result to determine whether the IC design is suitable for manufacturing, wherein
• the act of performing the statistical analysis determines an impact on a component in the IC design caused by at least one non-neighboring circuit component, which is not neighboring the component, and
• producing a physical layout based at least in part upon the result of the statistical analysis of the IC design, wherein
• the physical layout does not include the known bad pattern, and the known bad pattern is based at least in part upon one or more criteria specific to the desired function.