Validating manufacturing test rules pertaining to an electronic component

A computer program product comprising:

• a computer readable storage medium having instructions embodied therewith for validating a specified manufacturing test rule pertaining to an electronic component, the instructions comprising:
• instructions for generating a file of test data sets, wherein each test data set in said file is valid for said rule, and each test data set includes a stimulus that comprises one or more single input vector, and a set of results that are expected when the stimulus is applied to said electronic component;
• instructions for, responsive to recognizing that said electronic component has at least an analog element or a customized digital logic element, selectively creating a wrapper file to instantiate a base design corresponding to the electronic component and to selectively adapting ports disclosed by the base design for simulation;
• instructions for constructing a testbench to prepare each of a plurality of testcases for simulation, wherein each testcase corresponds to the stimulus and the expected results of a different one of said test data sets, and each testcase is disposed to be simulated separately from every other testcase;
• instructions for selectively preparing each of said testcases for simulation, in order to provide simulated results for the stimulus corresponding to each testcase;
• and
• instructions for comparing the simulated results and the corresponding expected results for each testcase, to determine whether there are any differences therebetween.

A data processing system for validating a specified manufacturing test rule pertaining to an electronic component, the data processing system comprising:

• a bus system;
• a communications system connected to the bus system;
• a memory connected to the bus system, wherein the memory includes computer usable program code;
• and
• a processing unit connected to the bus system, wherein the processing unit executes the computer usable program code to generate a file of test data sets, wherein each test data set in said file is valid for said rule, and each test data set includes a stimulus that comprises one or more single input vectors, and a set of results that are expected when the stimulus is applied to said electronic component;
• in response to recognizing that said electronic component has at least an analog element or a customized digital logic element, selectively create a wrapper file to instantiate a base design corresponding to the electronic component and selectively adapt ports disclosed by the base design for simulation;
• construct a testbench to prepare each of a plurality of testcases for simulation, wherein each testcase corresponds to the stimulus and the expected results of a different one of said test data sets, and each testcase is disposed to be simulated separately from every other testcase;
• selectively prepare each of said testcases for simulation, in order to provide simulated results for the stimulus corresponding to each testcase;
• and
• compare the simulated results and the corresponding expected results for each testcase, to determine whether there are any differences therebetween.