Connection board, probe card, and electronic device test apparatus comprising same

A connection board for electrically connecting a device under test and an electronic device test apparatus when testing the device under test, the connection board comprising:

• contactors for electrical connection with input/output terminals of the device under test;
• a first board on which the contactors are mounted;
• a second board having interconnect patterns electrically connected with the contactors;
• a support member supporting the first board;
• a first reinforcing member to which the support member is fixed;
• and
• a second reinforcing member which is fixed to the first reinforcing member and which is fixed to the second board at an outer peripheral part of the second reinforcing member, wherein
• the first board and the second board are not in contact with each other,
• a first through hole is formed in the first board and runs from a front surface of the first board to a back surface of the first board,
• the contactors and the interconnect patterns of the second board are electrically connected via bonding wires passing through the first through hole,
• the bonding wires are provided with slack,
• the first reinforcing member is interposed between the second board and the second reinforcing member, and
• the first reinforcing member is fixed to the second board via the second reinforcing member.