Nitride semiconductor device with a vertical channel and method for producing the nitride semiconductor device
AssigneeRohm Co., Ltd.
InventorsHirotaka Otake, Shigefusa Chichibu
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AssigneeRohm Co., Ltd.
InventorsHirotaka Otake, Shigefusa Chichibu
Estimating the term…
A nitride semiconductor device includes: a semiconductor base layer made of a conductive group III nitride semiconductor having a principal plane defined by a nonpolar plane or a semipolar plane; an insulating layer formed on the principal plane of the semiconductor base layer with an aperture partially exposing the principal plane; a nitride semiconductor multilayer structure portion, formed on a region extending onto the insulating layer from the aperture, having a parallel surface parallel to the principal plane of the semiconductor base layer as well as a +c-axis side first inclined surface and a −c-axis side second inclined surface inclined with respect to the principal plane of the semiconductor base layer and including two types of group III nitride semiconductor layers at least having different lattice constants; a gate electrode formed to be opposed to the second inclined surface; a source electrode arranged to be electrically connected with the group III nitride semiconductor layers; and a drain electrode formed on a back surface of the semiconductor base layer opposite to the principal plane.
A nitride semiconductor device comprising:
A method for producing a nitride semiconductor device, comprising the steps of:
Dependencies are inferred from the claim text.