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US 8,134,119 B2Granted
Reflectron
AssigneeCameca Instruments, Inc.
InventorPeter Panayi
Life of this patent
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Abstract
A reflectron (1) for deflecting an ion from a specimen in a time-of-flight mass spectrometer comprises a front electrode (2) and a back electrode (3). At least one of the front and back electrodes (2, 3) is capable of generating a curved electric field. The front and back electrodes are configured to perform time focusing and resolve an image of a specimen.
Claims21
A reflectron for deflecting an ion from a specimen in a time-of-flight mass spectrometer, comprising:
- a front electrode;
- and
- a back electrode;
- with an ion flight path extending at least partially therebetween;
- wherein at least one of the front and back electrodes is capable of generating a curved electric field intersecting the ion flight path;
- the front and back electrodes are configured to perform time focusing and resolve an image of a specimen.
3 more elements
Dependencies are inferred from the claim text.