Film formation method and apparatus for semiconductor process
AssigneeTokyo Electron Limited
InventorsKazuhide Hasebe, Nobutake Nodera, Eun-jo Lee
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AssigneeTokyo Electron Limited
InventorsKazuhide Hasebe, Nobutake Nodera, Eun-jo Lee
Estimating the term…
A film formation process is performed to form a silicon nitride film on a target substrate within a process field configured to be selectively supplied with a first process gas containing a silane family gas and a second process gas containing a nitriding gas. The method is preset to compose the film formation process of a main stage with an auxiliary stage set at one or both of beginning and ending of the film formation process. The main stage includes an excitation period of supplying the second process gas to the process field while exciting the second process gas by an exciting mechanism. The auxiliary stage includes no excitation period of supplying the second process gas to the process field while exciting the second process gas by the exciting mechanism.
A film formation method for a semiconductor process for forming a silicon nitride film as a product film on a plurality of target substrates supported at intervals in a vertical direction on a support member within a process field inside a process container configured to be selectively supplied with a silicon source gas and a nitriding gas and communicating with an exciting mechanism for generating plasma to excite the nitriding gas,
A computer readable, non-transitory storage medium containing program instructions for execution on a processor, which is used for a film formation apparatus for a semiconductor process including a process field inside a process container configured to be selectively supplied with a silicon source gas and a nitriding gas and communicating with an exciting mechanism for generating plasma to excite the nitriding gas, wherein the program instructions, when executed by the processor, cause the film formation apparatus to conduct a film formation method for a semiconductor process for forming a silicon nitride film as a product film on a plurality of target substrates supported at intervals in a vertical direction on a support member within the process field,
Dependencies are inferred from the claim text.