Systems and methods for predicting failure of electronic systems and assessing level of degradation and remaining useful life
AssigneeImpact Technologies, LLC
InventorsPatrick W. Kalgren, Antonio E. Ginart, Sashank Nanduri, Anthony J. Boodhansingh, Carl S. Byington, Rolf F. Orsagh, Brian J. Sipos, Douglas W. Brown, Christopher M. Minnella, Mark Baybutt
Life of this patent
Estimating the term…