A non-transitory computer-readable storage medium that stores a program which, when executed by a computer, causes the computer to perform a simulation process related to a semiconductor integrated circuit, said simulation process comprising:
- a first analyzing procedure causing the computer to carry out a layout analysis based on layout data of a circuit formed by cells, and to store values of first layout parameters that are obtained by the layout analysis and represent a first layout into a storage part;
- an extracting procedure causing the computer to extract basic cell characteristics of the cells from a net list, to represent the extracted basic cell characteristics by second layout parameters that represent a second layout different from the first layout, and to store the basic cell characteristics represented by the second layout parameters into the storage part, said basic cell characteristics including at least one of a noise characteristic and a leak current;
- an acquiring procedure causing the computer to read the values of the first layout parameters from the storage part, to substitute the read values into the basic cell characteristics represented by the second layout parameters to obtain cell characteristics, and to store the cell characteristics in the storage part;
- and
- a second analyzing procedure causing the computer to analyze an operation of the circuit using the cell characteristics obtained by the acquiring procedure,
- wherein the second layout parameters represent the second layout which is used to form the basic cell characteristics into a function by varying values of the second layout parameters within a range tolerable by the layout analysis with respect to the first layout to which first analyzing procedure carries out the layout analysis.