Method and apparatus for evaluating paths in an integrated circuit design
AssigneeXilinx, Inc.
InventorsKuok-Khian Lo, Mark B. Roberts, Mohammed Fakhruddin, James Karp, Richard P. Burnley, Min-Hsing Chen
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AssigneeXilinx, Inc.
InventorsKuok-Khian Lo, Mark B. Roberts, Mohammed Fakhruddin, James Karp, Richard P. Burnley, Min-Hsing Chen
Estimating the term…
An embodiment of the invention involves: providing a database that includes layout information representing a layout within an integrated circuit of an electrical circuit; identifying from the information in the database each conductive path of a selected type in the electrical circuit; extracting layout information from the database for each conductive path of the selected type; and calculating an electrical parameter for each conductive path of the selected type, as a function of the layout information obtained for that conductive path during the extracting. In addition, in a different configuration of the embodiment, a report can be generated containing information based on the electrical parameter calculated during the calculating for at least one of the conductive paths of the selected type.
An apparatus comprising:
A method comprising:
A method to protect an integrated circuit by employing a database that includes schematic information representing a circuit schematic for the integrated circuit and layout information regarding a layout of the integrated circuit, the integrated circuit having external pads and electro-static discharge (ESD) elements, the method comprising:
Dependencies are inferred from the claim text.