Method for simulating thermal resistance value of thermal test die

A method for simulating a thermal resistance value of a thermal test die performed by a software program of a processor, comprising:

• determining a size of one of a plurality of heating blocks according to a temperature distribution of the thermal test die, wherein the step of determining the size of the one heating block according to the temperature distribution of the thermal test die comprises:
• providing a thermal resistance value RTTV of the thermal test die;
• providing thermal resistance values Rheater for the plurality of heating blocks, and obtaining a relationship between the sizes of the plurality of heating blocks and the thermal resistance values Rheater of the plurality of heating blocks;
• and
• setting a target value RTarget to determine the size of the one heating block that matches the target value RTarget;
• setting at least one parameter for thermal performance testing, heating the heating block, and measuring a transient response value Rheater-T of thermal resistance of the heating block;
• and
• verifying whether a relationship between the transient response value Rheater-T of thermal resistance of the one heating block and a steady-state response value RTTV-S of thermal resistance of the thermal test die is within a range of a setting variation with the software program of the processor, and when the relationship between the transient response value Rheater-T of the thermal resistance of the one heating block and the steady-state response value RTTV-S of the thermal resistance of the thermal test die is not within the range of the setting variation, the target value is reset to determine another size of the one heating block that matches the reset target value, and
• wherein the reset target value is more close to the thermal resistance value RTTV of the thermal test die compared to the former set target value RTarget.