Test apparatus
AssigneeAdvantest Corporation
InventorToshiaki Adachi
Life of this patent
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AssigneeAdvantest Corporation
InventorToshiaki Adachi
Estimating the term…
Provided is a test apparatus 10, which includes: a plurality of test modules 150, each of which is connected to any of the plurality of devices under test 100 to supply a test signal to the connected device under test 100; a plurality of site controllers 130 that control the plurality of test modules 150 to test the respective plurality of devices under test 100 simultaneously; a connection setting device 140 that sets a connection mode between the plurality of site controllers 130 and the plurality of test modules 150 so that each of the test modules 150 is connected to any of the plurality of site controllers 130; and a plurality of system controllers 110, each of which controls any of the plurality of site controllers 130, in which a predetermined system controller of the plurality of system controllers 110 assigns, in response to a request from another system controller of the system controllers, a site controller of the site controllers, which is to be controlled by the another system controller.
A test apparatus that tests a plurality of devices under test, comprising:
A test apparatus that tests a device under test having a plurality of functional blocks, comprising:
Dependencies are inferred from the claim text.