Storage media defect detection
AssigneeLink—A—Media Devices Corporation
InventorsHaitao Xia, Yenyu Hsieh, Bac Pham
Life of this patent
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Abstract
Detecting a defect on a storage device is disclosed. Detecting includes receiving a signal read from a storage device, sampling the signal to obtain a set of signal samples, wherein the sampling starts at an arbitrary time, computing a defect value for a defect type using the set of signal samples, comparing the defect value with a threshold associated with the defect type, determining whether there is a defect of the defect type based at least in part on the comparison, and in the event that a defect is detected, outputting an indication associated with the defect.
Claims45
A method for detecting a defect on a storage device, comprising:
- receiving a signal read from a storage device;
- sampling the signal with an arbitrary phase offset to obtain a set of signal samples;
- computing with a processor a defect value for a defect type using the set of signal samples, wherein the defect value is computed at least in part based on a relationship corresponding to a sine waveform, and wherein computing includes computing the difference between a first sample and a third sample in a sequence of three samples to obtain a first difference;
- comparing the defect value with a threshold associated with the defect type;
- determining whether there is a defect of the defect type based at least in part on the comparison;
- and
- in the event that a defect is detected, outputting an indication associated with the defect.
A system for detecting a defect on a storage device, comprising:
- a processor configured to:
- receive a signal read from a storage device;
- sample the signal with an arbitrary phase offset to obtain a set of signal samples;
- compute a defect value for a defect type using the set of signal samples, wherein the defect value is computed at least in part based on a relationship corresponding to a sine waveform, and wherein computing a defect value includes computing the difference between a first sample and a third sample in a sequence of three samples to obtain a first difference;
- compare the defect value with a threshold associated with the defect type;
- determine whether there is a defect of the defect type based at least in part on the comparison;
- and
- in the event that a defect is detected, output an indication associated with the defect;
- and
- a memory coupled with the processor, wherein the memory is configured to provide the processor with instructions.
A computer program product for detecting a defect on a storage device, the computer program product being embodied in a non-transitory computer readable medium and comprising computer instructions for:
- receiving a signal read from a storage device;
- sampling the signal with an arbitrary phase offset to obtain a set of signal samples;
- computing a defect value for a defect type using the set of signal samples, wherein the defect value is computed at least in part based on a relationship corresponding to a sine waveform, and wherein computing includes computing the difference between a first sample and a third sample in a sequence of three samples to obtain a first difference;
- comparing the defect value with a threshold associated with the defect type;
- determining whether there is a defect of the defect type based at least in part on the comparison;
- and
- in the event that a defect is detected, outputting an indication associated with the defect.
Dependencies are inferred from the claim text.