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US 8,076,946 B1Granted
Leakage calibration
AssigneeMarvell Israel (M.I.S.L) Ltd.
InventorEitan Rosen
Life of this patent
Estimating the term…
Abstract
An integrated circuit and a method for efficiently operating integrated circuit devices. The integrated circuit includes an input that is configured to receive a first current which is representative of a leakage current drawn by leakage in a portion of the integrated circuit. The integrated circuit includes a leakage calibrator that is configured to compare the first current to a current required to perform a switching operation and output a value indicative of the leakage.
Claims16
An integrated circuit, comprising:
- an input configured to receive a first current which is representative of a leakage current drawn by leakage in a portion of the integrated circuit;
- and
- a leakage calibrator configured to compare the first current to a current required to perform a switching operation and output a value indicative of the leakage, the leakage calibrator comprising:
- a model load coupled to a first node, the model load being configured to discharge a model leakage current at a first discharge rate;
- a leakage load coupled to a second node, the leakage load discharging the first current;
- and
- a controller coupled to the model load, the controller being configured to control the first discharge rate on a basis of said value.
4 more elements
A method for determining leakage in an integrated circuit, comprising:
- receiving a first current that is representative of a leakage current drawn by leakage in a portion of the integrated circuit, the first current being discharged by a leakage load;
- comparing the first current to a model leakage current required to perform a switching operation, the model leakage current being discharged by a model load at a first discharge rate;
- outputting a value indicative of the leakage:
- and
- controlling the first discharge rate on a basis of said value.
2 more elements
Dependencies are inferred from the claim text.