Organic EL display device and manufacturing method of the same
AssigneeCanon Kabushiki Kaisha
InventorsKouji Oda, Hiroyuki Fuchigami, Yusuke Yamagata, Katsumi Nakagawa, Junji Ohyama
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Abstract
An organic EL display device includes a glass substrate and a flattening film arranged above the glass substrate. A plurality of anodes are arranged on a surface of the flattening film. A plurality of organic EL layers are arranged on a surface of the anodes. The flattening film has irregularities formed in at least a partial surface in a region outside a region where the plurality of organic EL layers are arranged. According to such a structure, an organic EL display device in which remaining of moisture in an insulating film is suppressed can be provided.
Claims6
An organic EL display device, comprising:
- a substrate;
- a protection film;
- a flattening film arranged above said protection film,
- a plurality of first electrodes arranged on a surface of said flattening film;
- and
- a plurality of organic EL layers arranged on a surface of said first electrodes,
- said flattening film having first irregularities being independent of said protection film and not penetrating said flattening film, and
- wherein said first irregularities have an arithmetic mean deviation of roughness profile Ra per 1 μm2 of at most 80 nm.
An organic EL display device, comprising:
- a substrate;
- a protection film;
- a flattening film arranged above said protection film;
- a plurality of first electrodes arranged on a surface of said flattening film;
- a plurality of organic EL layers arranged on a surface of said first electrodes;
- and
- an isolating film arranged on said first electrodes and covering end portions of said first electrodes adjacent to each other,
- said flattening film having first irregularities being independent of said protection film and not penetrating said flattening film,
- said isolating film having a slope portion with a gradually decreasing film thickness at an end portion,
- said isolating film having second irregularities in a surface of a region except for said slope portion, and
- wherein said second irregularities have an arithmetic mean deviation of roughness profile Ra per 1 μm2 of at most 80 nm.
Dependencies are inferred from the claim text.