Semiconductor device and method for manufacturing the same
AssigneeFujitsu Semiconductor Limited
InventorsMakoto Takahashi, Kouichi Nagai
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Abstract
According to the method for manufacturing a semiconductor device, a surface of a lower insulating film (55) is planarized by CMP or the like, and an upper insulating film (56) and a protective metal film (59) are formed on the lower insulating film (55). Accordingly, the upper insulating film (56) and the protective metal film (59) are formed in such a manner they have an excellent coverage and the water/hydrogen blocking capability of the upper insulating film (56) and the protective metal film (59) is maximized.
Claims6
A method for manufacturing a semiconductor device, comprising the steps of:
- forming, above a semiconductor substrate, a capacitor structure including a lower electrode and an upper electrode that sandwich a dielectric film;
- forming, over the capacitor structure, a wiring structure electrically connected to the capacitor structure;
- forming a pad electrode electrically connected to the wiring structure;
- depositing a first insulating film to cover the pad electrode and planarizing a surface of the insulating film;
- forming, on the first insulating film, a second insulating film having a capability of preventing penetration of hydrogen and having a lower etching rate than that of the first insulating film;
- forming, in the second insulating film and the first insulating film, an opening exposing a portion of a surface of the pad electrode;
- and
- forming a protective metal film made of a moisture-resistant metal so that the protective metal fills the opening and is coupled to the pad electrode.
Dependencies are inferred from the claim text.