Monolithic silicon-based photonic receiver
AssigneeCornell Research Foundation, Inc.
InventorsAlyssa B. Apsel, Anand M. Pappu, Cheng Po Chen, Tao Yin
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Abstract
An integrated circuit, and method for manufacturing the integrated circuit, where the integrated circuit can include a phototransistor comprising a base having a SiGe base layer of a predetermined germanium composition and a thickness of more than 65 nm and less than about 90 nm. The integrated circuit can further include a transimpedance amplifier (TIA) receiving an output from the phototransistor. The phototransistor and the TIA can be built on a silicon substrate.
Claims11
A method for building an integrated circuit using a conventional BiCMOS process, the conventional BiCMOS process comprising extensive use of planarization techniques, the method comprising the steps of:
- manufacturing, using the conventional BiCMOS process, a phototransistor having a base including an SiGe base layer of a pre-determined germanium composition and a thickness of more than 65 nm and less than about 90 nm;
- said phototransistor being comprised of a number of active regions, each active region, except a bottom active region, vertically disposed over another active region;
- coupling a transimpedance amplifier (TIA) to the phototransistor;
- configuring the TIA to receive an output directly from the phototransistor;
- configuring a capacitor between a collector of the phototransistor and an input to the TIA;
- said capacitor reducing an effect of collector-substrate junction on bandwidth;
- and
- configuring the phototransistor and the TIA on a silicon substrate.
A method for building an integrated circuit using a conventional BiCMOS process the conventional BiCMOS process comprising extensive use of planarization techniques, the method comprising the steps of:
- Manufacturing, using the conventional BiCMOS process, a first phototransistor having a first base including an SiGe base layer of a pre-determined germanium composition and a thickness of more than 65 nm and less than about 90 nm;
- said first phototransistor being comprised of a number of active regions, each active region, except a bottom active region, vertically disposed over another active region;
- Manufacturing, using the conventional BiCMOS process, a second phototransistor having a second base including an SiGe base layer of a pre-determined germanium composition and a thickness of more than 65 nm and less than about 90 nm;
- said second phototransistor being comprised of a number of active regions, each active region vertically disposed over another active region;
- configuring a capacitor between a second output of the second phototransistor and a ground;
- receiving a first output from the first phototransistor and the second output of the second phototransistor into a differential amplifier;
- configuring the first phototransistor, the second phototransistor, and the differential amplifier on a silicon substrate.
A method for improving bandwidth of a photonic receiver, the method comprising the steps of:
- manufacturing, on a silicon substrate, a phototransistor having a base including an SiGe base layer of a pre-determined germanium composition and a thickness of more than 65 nm and less than about 90 nm;
- said phototransistor being comprised of a number of active regions, each active region, except a bottom active region, vertically disposed over another active region;
- manufacturing, on said silicon substrate, a transimpedance amplifier (TIA) configured to achieve a predetermined bandwidth;
- and
- configuring a capacitor to reduce an effect of collector-substrate junction on bandwidth;
- the capacitor being configured between an output of the phototransistor and an input of the TIA, the capacitor connecting the output of the phototransistor to the input of the TIA;
- obtaining, by said manufacturing steps and said configuring, a photonic receiver with improved bandwidth.
A method for improving a bandwidth of a photonic receiver, the method comprising the steps of:
- manufacturing, on a silicon substrate, a first phototransistor having a first base including an SiGe base layer of a pre-determined germanium composition and a thickness of more than 65 nm and less than about 90 nm;
- said first phototransistor being comprised of a number of active regions, each active region, except a bottom active region, vertically disposed over another active region;
- manufacturing, on the silicon substrate, a second phototransistor having a second base including an SiGe base layer of a pre-determined germanium composition and a thickness of more than 65 nm and less than about 90 nm;
- said second phototransistor being comprised of a number of active regions, each active region, except a bottom active region, vertically disposed over another active region;
- manufacturing, on the silicon substrate, a differential amplifier;
- connecting a first output of the first phototransistor to a first input of the differential amplifier;
- filtering a second output of the second phototransistor with a substantially low pass filter, thereby obtaining a filtered output and
- connecting the filtered output of the second phototransistor to a second input of the differential amplifier;
- obtaining, by said manufacturing steps, said configuring steps and said connecting, a photonic receiver with improved bandwidth is obtained.
Dependencies are inferred from the claim text.